Device Characterization

LB_Noise Parameter Bench

Capabilities and Configurations

Comprehensive measurement capabilities and configurable test environments enable precise characterization of devices under application-relevant bias, temperature, and frequency conditions.

Measurement Types
  • Impedance Measurements
  • S-Parameters to 170 GHz, Higher on Request
  • Noise Parameters, Noise Figure and 1/f Noise
  • Load & Source Pull with Harmonic Tuning
  • DC and Pulsed IV for Transistors and Diodes
  • Intermodulation, Distortion and Compression
Test Configurations
  • On-wafer Probing of Wafer and Chip Devices
  • Surface-Mount Parts on PCB Test Boards
  • Multi-Port Component Characterization
  • Custom Microstrip and Coplanar Test Fixtures
  • PCB Coaxial & Waveguide Reference Plane Data
  • Chip and Wire Assembly, plus Test Support

Modelithics offers flexible measurement capabilities and can develop custom hardware, software, and high-power test solutions to address unique device characterization requirements.

Advanced Measurement Infrastructure

Advanced measurement benches deliver precise, repeatable characterization data to support accurate model development and simulation.

S-Parameter Measurements

VNA platforms cover the sweep to 170 GHz standard and higher on request. Mixed-mode designs get true 4-port measurement through 67 GHz.

Noise Characterization

Noise parameters run to 50 GHz, with noise figure and 1/f flicker noise. The screen room around the bench minimizes local interference.

Load and Source Pull

Automated tuners sweep the impedance plane, and the contours map output power, PAE, transducer gain, 1 dB compression and IM3.

DC and Pulsed IV Curves

Transistor and diode IV families under DC and pulsed bias, high power pulsed IV to 30 A, so self-heating and trapping stay visible.

Over-Temperature Testing

The sweeps repeat across the operating range, so you see how far the S-Parameters and IV curves move with temperature.

Modelithics Load-Pull Bench
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Where Measurement Meets Innovation

Advanced instrumentation, proven methodologies, and custom test solutions enable Modelithics to deliver accurate characterization data across a wide range of technologies and operating conditions.

Characterization Capabilities

  • Full 2-Port S-Paramaters to 170 GHz
  • True 4-Port S-Parameters through 67 GHz, Mixed-Mode
  • Noise Parameters to 50 GHz, plus a 75 to 110 GHz Band
  • Load & Source Pull Tuning to 50 GHz and 75 to 110 GHz
  • High Power Pulsed IV to 30 A, and Temperature Sweeps

Test Bench Capabilities

Characterization and Modeling Capabilities

Multiple vector network analyzer (VNA) test platforms cover the following frequency bands:
Equipment
Frequency Range
Measurement Type
ENA Series Network Analyzer5 Hz to 3 GHzS-Parameter
HP 8753 (multiple)30 kHz to 6 GHzS-Parameter
Keysight PNA10 MHz to 67 GHzS-Parameter
Keysight PNA-X65 to 110 GHzS-Parameter
OML MM-Wave Extension Modules10 MHz to 67 GHzS-Parameter
OML MM-Wave Extension Modules110 to 170 GHzS-Parameter

True 4-port S-Parameter measurements through 67 GHz are available to support mixed-mode circuit design applications

*X-parameters is a trademark and registered trademark of Keysight Technologies in the US, EU, JP, and elsewhere. The X-parameters format and underlying equations are open and documented. For more information, visit Keysight X-Parameters Information

Noise measurements are performed in a screen room to minimize local electromagnetic interference.
Equipment
Frequency Range
Measurement Type
Custom Test Setup10 Hz to 100 KHz (extension to 1 MHz)1/f (flicker) Noise
Keysight PNA-X10 MHz to 50 GHzNoise Figure
Keysight PNA-X/Maury ATS0.2 – 50 GHzNoise Parameters
Mm-wave Noise>50 GHzNoise Figure/Noise Parameters
(Contact Modelithics)
Load- and source-pull measurements can be performed to generate impedance contours for optimizing the tradeoff between various amplifier performance parameters, such as output power and 1 dB compression, power-added-efficiency (PAE), transducer gain, and third-order-intermodulation distortion (IM3 or TOI).
Equipment
Frequency Range
Measurement Type
Maury MicrowaveFundamental tuning 0.2 to 50 GHzLoad/Source-Pull Non-Linear
Maury MicrowaveFundamental tuning 75 to 110 GHz Load/Source-Pull Non-Linear
Maury MicrowaveHarmonic tuning (various bands)Load/Source-Pull Non-Linear
For transistor and diode characterization modeling, DC and pulsed measurements are made using the following equipment:
Equipment
Capabilities
Measurement Type
AMCAD AM3200DC, PulsedIV
Auriga AU4750PulsedIV
HP4142 DC Modular DC Source/MonitorDCIV
Many other measurements and software tools are available to help support model development requirements, including
Equipment
Frequency Range
Measurement Type
Boonton Resonant Coaxial LineMeasurement of high Q capacitorsImpedance
Keithley 590 CV AnalyzerCV at 100kHz or 1 MHzCapacitance vs Voltage
Keysight 4219A Impedance AnalyzerImpedance analyzer (1 – 1800 MHz)Impedance
Keysight 4287A RF LCR MeterLCR meter (1 – 3000 MHz)Impedance
Keysight E4991A RF Impedance AnalyzerImpedance analyzer (1 – 3000 MHz)Impedance
Other Software

Lab automation software includes: Keysight Technologies ICCAP, Formfactor WinCal, MPI Q’Alabria, Maury Microwave Insight Pro, AMCAD IVCAD, in-house automation, QA, and calibration programs. and other software tools.

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Measurement Data You Receive

Modelithics documents its released models down to the measurement conditions and the typical range of validity. Characterization data goes out to that same standard, in file formats a simulator reads directly.

What comes back depends on which benches the job runs:

  • Touchstone S-Parameter files per bias point
  • Data files from the noise, pull and IV benches
  • Measured plots for each quantity on the job
  • Calibration and reference-plane documentation
  • The bias and temperature each sweep was run at

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Gain the measurement insight needed to accelerate model development, validate performance, and optimize designs with Modelithics characterization services.

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