Modelithics® Inc. provides a broad array of highest quality, RF/microwave/mm-wave characterization services. Modelithics emphasizes wafer probe measurements of semiconductor wafer and chip, as well as surface mount components assembled on hybrid boards. Other measurement configurations involving microstrip or coplanar test fixtures, and measurements to coaxial or waveguide reference planes are available. Among the many measurement capabilities offered, Modelithics can measure s-parameters up to 110GHz standard and even higher frequencies upon request. We offer noise parameter measurements up to 50GHz, load pull, IV, impedance measurements, and more.
Please see our additional services for Modeling and *X-parameters. for examples of some of the modelithics services, see our literature area
Multiple vector network analyzer (VNA) test platforms cover the following frequency bands:
Equipment | Frequency Range | Measurement Type |
---|---|---|
HP 8510C (multiple) | 0.045 to 50 GHz | S-Parameter |
HP 8753 (multiple) | 30 kHz to 6 GHz | S-Parameter |
Keysight PNA | 10 MHz to 67 GHz | S-Parameter |
Keysight PNA/Oleson MM-wave Extension Modules | 10 MHz to 110 GHz | S-Parameter |
Keysight PNA-X | 10 MHz to 67 GHz | S-Parameter |
OML MM-Wave Extension Modules | 65 to 110 GHz | S-Parameter |
OML MM-Wave Extension Modules | 110 to 170 GHz | S-Parameter |
*X-parameters is a trademark and registered trademark of Keysight Technologies in the US, EU, JP, and elsewhere. The X-parameters format and underlying equations are open and documented. For more information, visit Keysight X-Parameters Information
Equipment | Frequency Range | Measurement Type |
---|---|---|
Custom Test Setup | 10Hz to 100 KHz (extension to 1 MHz) | Noise |
HP 8510C (multiple) | 300 MHz to 26.5GHz | Noise |
HP 8970/HP8971 | 10 MHz to 50 GHz (50-110 GHz*) | Noise |
Keysight PNA-X | 10MHz to 50GHz | Noise |
Maury ATN NP5 | 0.3 to 50 GHz (75-110 GHz*) | Noise |
Title | Author | Date | |
---|---|---|---|
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50GHz High Frequency Noise Parameter Measurements | Modelithics, Inc. | 7/14/2016 |
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1/f Noise Testing | Modelithics, Inc. | 1/1/2014 |
Equipment | Frequency Range | Measurement Type |
---|---|---|
Maury ATS | Fundamental tuning 0.2 to 50 GHz | Load/Source-Pull Non-Linear |
Maury ATS | Fundamental tuning 75 to 110 GHz | Load/Source-Pull Non-Linear |
Maury ATS | Harmonic tuning 2.45 GHz, 5.25 GHz fundamental | Load/Source-Pull Non-Linear |
Equipment | Capabilities | Measurement Type |
---|---|---|
Accent DIVA | DC, Pulsed | IV |
AMCAD AM3200 | DC, Pulsed | IV |
Auriga AU4750 | Pulsed | IV |
HP4142 DC Modular DC Source/Monitor | DC | IV |
Many other measurements and software tools are available to help support model development requirements, including:
Equipment | Frequency Range | Measurement Type |
---|---|---|
Boonton Resonant Coaxial Line | Measurement of high Q capacitors | Impedance |
Keithley 590 CV Analyzer | CV at 100kHz or 1 MHz | Capacitance vs Voltage |
Keysight 4219A Impedance Analyzer | Impedance analyzer (1 – 1800 MHz) | Impedance |
Keysight 4287A RF LCR Meter | LCR meter (1 – 3000 MHz) | Impedance |
Keysight E4991A RF Impedance Analyzer | Impedance analyzer (1 – 3000 MHz) | Impedance |