Modelithics is pleased to announce our newest offering of Test Fixtures and Test Accessory products, including legacy parts from J MicroTechnology for a family of thin film Alumina substrate components to adapt the benefits of coplanar waveguide wafer probe test methods to the measurement of devices suited for connection to microstrip circuits. Along with this offering Modelithics is also offering custom coaxial and RF probe test fixtures suited for a wide range of substrate and test interface environments.
These components enhance productivity in product development and product assurance testing for semiconductors and packages. Some versions are available with series resis-tors to provide bias current stability. Calibration structures substrate and companion print-ed calibration kits are available for various adapter substrate configurations.
The products are test adapter and interface circuits. Each adapter circuit type primarily transforms a signal path from coplanar waveguide to microstrip transmission mode. Additional features of Series resistors and DC and signal sense are present on some product types. The products are ideal for testing GaAs/GaN as well as Silicon transistors, diodes and RFIC/MMIC die devices. Alumina Probe-Point™ substrate fixtures are available in 5, 10 and 15 mil thickness, making them compatible with a wide range of packages and high performance microwave semiconductors.
Be sure to ask about our quantity discounts!