Characterization Services

Modelithics has an extensive array of test equipment and expertise to guarantee complete and accurate testing of a wide variety of RF/microwave parameters. Despite our excellent equipment inventory, our most valuable assets are the discipline and professionalism we demonstrate in precise measurement and careful documentation.

Click to download the full Characterization Services Brochure (PDF-790 kB)

Wafer-Probe and other Configurations

Modelithics emphasizes wafer probe measurements of semiconductor wafers and chips, as well as surface-mount components assembled on hybrid boards. Other configurations include microstrip and coplanar test fixtures, and RF measurements to coaxial or waveguide reference planes.

S-Parameter Measurements

Multiple vector network analyzer (VNA) test platforms cover the following frequency bands:
30 kHz to 6 GHz
HP 8753
0.045 to 50 GHz
HP 8510C
0.040 to 40 GHz
Anritsu Lightning
0.040 to 65 GHz
Anritsu Lightning
   65-110 GHz
Anritsu Wiltron 360/Oleson MM-wave Extension Modules
 

True 4-port S-parameter measurements through 26 GHz are available to support mixed-mode circuit design applications.
Noise Measurements
 

Noise measurements are performed in a screen room to minimize local electromagnetic interface.
Flicker (1/f) Noise

10Hz to 100kHz (extension to 1 MHz available)

Custom test setup
 
50 ohm Noise Figure

10 MHz to 26 GHz
HP8970/HP8971
 
Noise Parameters (NFmin, Rn, Gopt)

2 to 26 GHz

Maury ATN NP5
 
Noise Parameters (NFmin, Rn, Gopt)

0.3 to 6 GHz

Maury ATN NP5
  
 
 

Other Bands

Contact Modelithics
 
*Advanced development capability used less frequently than the below 26 GHz noise parameter systems. Basic measurements include the standard noise parameters Fmin, Gamma-opt, Rn
Load- and Source-Pull Measurements

Load- and source-pull measurements can be performed to generate impedance contours for optimizing the tradeoff between various amplifier performance parameters, such as output power and 1 dB compression, power-added-efficiency (PAE), transducer gain, and third-order-intermodulation distortion (IM3 or TOI).

  • Fundamental tuning 0.2 to 50 GHz Maury ATS
  • Harmonic tuning 2.45 GHz, 5.25 GHz fundamental (2nd and 3rd harmonic can be tuned)
  • Fundamental tuning 75 to 110 GHz Maury ATS
DC and Pulsed IV

For transistor and diode characterization modeling, DC and pulsed measurements are made using the following equipment:

  • DC IV characterization - HP4142 DC Parameter Analyzer, Keithley 4200 Semiconductor Parameter Analyzer
  • Pulsed IV measurements - Accent DIVA
  • C-V measurements - Keithley 590
Other Instrumentation and Software

Many other measurements and software tools are available to help support model development requirements, including:

  • Q-factor measurements of discrete passives - Boonton Resonant Coaxial Line
  • Impedance measurements to 3 GHz - Agilent 4287A
  • CAE and electromagnetic simulation software from Agilent Technologies (ADS, ICCAP, Momentum), Ansoft (HFSS, Designer), Applied Wave Research (Microwave Office), Agilent Eagleware (GENESYS), Cadence (Spectre RF and PSPICE) Gateway Modeling (Special), NIST (Multical), Maury Microwave, Sonnet Software, and other companies.